Improving your scanning and bite registration strategies in All-on-X cases

The adoption of intraoral scanners in fully digital All-on-X workflows is becoming increasingly common. Although scanner technology has advanced, the accuracy and reliability of full-arch scans remain a topic of concern. Various scanning aids have been introduced, each claiming to enhance scan quality. This lecture aims to explain the principles behind peripheral, radial, and central scan aids, with a particular emphasis on how each technique works. It will present the clinical steps involved in the radial scanning workflow. Additionally, the lecture will introduce a practical approach to digital bite registration for full-arch cases.

The widespread adoption of intraoral scanners has revolutionized the All-on-X workflow, enabling clinicians to transition from conventional impressions to fully digital protocols. While scanner technology continues to evolve, full-arch implant scanning presents persistent challenges in accuracy and reliability due to factors like edentulous anatomy, implant angulation, and soft tissue mobility. To overcome these limitations, a variety of scan aids have been introduced—categorized as peripheral, radial, and central—each offering distinct advantages in stabilizing scan bodies and enhancing data capture. This lecture delves into the principles behind these scan aid techniques, with a particular emphasis on the radial scanning workflow. Attendees will gain insight into the step-by-step clinical procedures required to implement radial scanning effectively, including positioning strategies and scan path optimization. Furthermore, the lecture will present a practical approach to digital bite registration tailored for full-arch implant cases, addressing occlusal accuracy and prosthetic fit. By combining advanced scanning techniques with reliable bite registration methods, clinicians can achieve more predictable outcomes in complex implant restorations.